課程大綱 Syllabus 
學生學習目標 Learning Objectives 
單元學習活動 Learning Activities 
學習成效評量 Evaluation 
備註 Notes 
序 No.  單元主題 Unit topic 
內容綱要 Content summary 
1  I. Preliminary 
Sample Preparation for TEM
Concepts of vacuum Background Review 
The student will learn the background of the development of electron microscope and the based techniques of sample preparations. 



2  I. Preliminary 
Sample Preparation for TEM
Concepts of vacuum 
The concepts of vacuum will describe for student to undersatnd the system design of TEM. 



3  II. Physical Description of Electron Microscopy 
Historical Background
Geometric optics 
The histroy of EM will introduce in this week. The principle of geometric optics is compared to the electron optics and guide student to undersatnd the electron optic system in EM. 



4  II. Physical Description of Electron Microscopy 
Properties of electrons
Resolution Limitations of Imaging Systems 
The propeties of electrons are important to understand the optics and wave properties of electron. It will affect the resolution limitation of EM. Students will guide to learn the physical properties of electron microscope. 



5  II. Physical Description of Electron Microscopy 
Lenses for electrons
Electron Sources 
The lenses of electrons will introduce in this week. Student will learn the design principle of magnetic lens. Also, the different electron sources are compared for student to know the importance of field emission source in recent EM. 



6  II. Physical Description of Electron Microscopy 
Operating principles of TEM, SEM, STEM
Construction of TEM, SEM, STEM 
Students will learn the operating principles of TEM, SEM and STEM. Also, this week will guide the student to understand the construction of TEM, SEM and STEM systems. 



7  II. Physical Description of Electron Microscopy 
Information obtained from TEM, SEM, STEM 
The students will learn the information that electron microscope can obtain. It will help student to analysis the image and stucture of materials. 



8  II. Geometry of Electron Diffraction 
Reciprocal lattice constructions
Ewald sphere constructions 
The foundament of diffration will review for student to understand the principle of reciprocal lattice. It will help student to analysis the structure of material using electron diffraction. 



9  Midterm Exam 
The midterm exam will cover Chapter I to II and the the principle of reciprocal lattice that is introdcue in Chapter III. 
To evalute the learn achievement of students for past 8 weeks. 



10  III. Geometry of Electron Diffraction 
Wavevectors formulation of diffraction, deviation parameter 
Student will learn the principle and deviation of electron diffraction. The will help students to analysis the diffratcion pattern to study the structure of materials. 



11  III. Geometry of Electron Diffraction 
Kikuchi patterns and channelling patterns 
Kikuchi patterns and channelling patterns are important in structure analysis. Students will deeply learn how to analysis the structure of materials more precisously. 



12  IV. Principles of Image Formation 
Interactions of electrons with matter, scattering
Kinematical theory of scattering 
The students will learn the interaction of electron and matter. That will affect the contrast of image. It will help to interpret the information of images. The theory of imfomation will also introduce. 



13  IV. Principles of Image Formation 
Kinematical theory of scattering
Dynamical theory of scattering (HowieWhelan Equations) 
This week will mostly introduce the theory of image formation. Students will learn the image formation from the basic theory. 



14  IV. Principles of Image Formation 
Image interpretation 
The case study of image interpretation will introduce in this week. Students will practically learn to interpretation image in different defects of materials. 



15  V. Analytical Electron Microscopy 
Electron probes, beam current vs. size
SEM, STEM imaging 
This weeks will introduce the analytical function of EM. Students will undersatnd the important of probe sixe and current that affect the analytical EM. 



16  V. Analytical Electron Microscopy 
Microdiffraction and nanodiffraction
Convergent beam electron diffraction 
The capacitity of micordiffration and nanomicrodiffraction are important for mordern EM in nanoanalysis. Students will guide how to use these techniques for material analysis. 



17  V. Analytical Electron Microscopy 
Xray analysis
Electron energy loss spectroscopy 
Elemental anlysis used EM will introduce in this week. It includes EDS, WDS and EELS analysis. Students will learn how to combine the structure, composition and image analysis techniques for material study. 



18  Final Exam 
Final exam will cover partial of Chapeter III and include all Chapter IV to V. 
Final evaulate the learn achievement of students. 


